Micro-Structural and Nano-Technology

Citations to U.S. patents by U.S. patents granted in 2025

Related WIPO fields:[Semiconductors | Materials, metallurgy | Optics | Basic materials chemistry | Measurement | Electrical machinery, apparatus, energy | Chemical engineering All WIPO fields  | Top 10 Overall | Main Page
[Cited by Examiner | Cited by Applicant]
Most Cited by Examiners  Dot Plot

  1. 7 10700064    Multi-threshold voltage gate-all-around field-effect transistor devices with common gates
  Inventors: Jingyun Zhang; Takashi Ando; ChoongHyun Lee

  1. 7 9954058    Self-aligned air gap spacer for nanosheet CMOS devices
  Inventors: Shogo Mochizuki; Alexander Reznicek; Joshua M. Rubin; Junli Wang

  3. 6 9997519    Dual channel structures with multiple threshold voltages
  Inventors: Ruqiang Bao; Michael A. Guillorn; Vijay Narayanan

  4. 5 9991352    Methods of forming a nano-sheet transistor device with a thicker gate stack and the resulting device
  Inventors: Julien Frougier; Ali Razavieh; Ruilong Xie; Steven Bentley

  5. 4 10170638    Nanosheet substrate isolated source/drain epitaxy by dual bottom spacer
  Inventors: Alexander Reznicek

  5. 4 10243054    Integrating standard-gate and extended-gate nanosheet transistors on the same substrate
  Inventors: Kangguo Cheng; Juntao Li; Geng Wang; Qintao Zhang

  5. 4 10510620    Work function metal patterning for N-P space between active nanostructures
  Inventors: Daniel Chanemougame; Steven R. Soss; Steven J. Bentley; Julien Frougier; Ruilong Xie

  5. 4 11069684    Stacked field effect transistors with reduced coupling effect
  Inventors: Ruilong Xie; Chun-Chen Yeh; Dechao Guo; Alexander Reznicek

  5. 4 9362355    Nanosheet MOSFET with full-height air-gap spacer
  Inventors: Kangguo Cheng; Bruce B. Doris; Michael A. Guillorn; Xin Miao

  5. 4 9608116    FINFETs with wrap-around silicide and method forming the same
  Inventors: Kuo-Cheng Ching; Ching-Wei Tsai; Chi-Wen Liu; Chih-Hao Wang; Ying-Keung Leung

  5. 4 9947804    Methods of forming nanosheet transistor with dielectric isolation of source-drain regions and related structure
  Inventors: Julien Frougier; Min Gyu Sung; Ruilong Xie; Chanro Park; Steven Bentley

[Cited by Examiner | Cited by Applicant]
Most Cited by Applicants  Dot Plot

  1. 295 9236267    Cut-mask patterning process for fin-like field effect transistor (FinFET) device
  Inventors: Ho Wei De; Kuei-Liang Lu; Ming-Feng Shieh; Ching-Yu Chang

  2. 293 9576814    Method of spacer patterning to form a target integrated circuit pattern
  Inventors: Chieh-Han Wu; Cheng-Hsiung Tsai; Chung-Ju Lee; Ming-Feng Shieh; Ru-Gun Liu; Shau-Lin Shue; Tien-I Bao

  3. 292 9520482    Method of cutting metal gate
  Inventors: Po-Chin Chang; Chih-Hao Wang; Kai-Chieh Yang; Shih-Ting Hung; Wei-Hao Wu; Gloria Wu; Inez Fu; Chia-Wei Su; Yi-Hsuan Hsiao

  4. 214 9608116    FINFETs with wrap-around silicide and method forming the same
  Inventors: Kuo-Cheng Ching; Ching-Wei Tsai; Chi-Wen Liu; Chih-Hao Wang; Ying-Keung Leung

  5. 186 9502265    Vertical gate all around (VGAA) transistors and methods of forming the same
  Inventors: Ching-Hong Jiang; Li-Ting Wang; Teng-Chun Tsai; Shih-Chiang Chen

  5. 186 9536738    Vertical gate all around (VGAA) devices and methods of manufacturing the same
  Inventors: Yu-Lien Huang; Chun-Hsiung Lin; Chi-Wen Liu

  7. 166 9209247    Self-aligned wrapped-around structure
  Inventors: Jean-Pierre Colinge; Kuo-Cheng Ching; Ta-Pen Guo; Carlos H. Diaz

  8. 163 9412817    Silicide regions in vertical gate all around (VGAA) devices and methods of forming same
  Inventors: Kai-Chieh Yang; Wai-Yi Lien

  8. 163 9412828    Aligned gate-all-around structure
  Inventors: Kuo-Cheng Ching; Jean-Pierre Colinge; Zhiqiang Wu

  8. 163 9472618    Nanowire field effect transistor device having a replacement gate
  Inventors: Richard Kenneth Oxland

 
 
References:
Raw data from: U.S. Patent and Trademark Office "Open Data Portal." Accessed May 13, 2026. http://data.uspto.gov/bulkdata/datasets/pvgpatdis?fileDataFromDate=1976-01-01&fileDataToDate=2025-12-31.

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Published: May 18, 2026